X-Ray Diffraction by Polycrystalline Materials

X-Ray Diffraction by Polycrystalline Materials
Author :
Publisher : John Wiley & Sons
Total Pages : 290
Release :
ISBN-10 : 9781118613955
ISBN-13 : 1118613953
Rating : 4/5 (953 Downloads)

Book Synopsis X-Ray Diffraction by Polycrystalline Materials by : René Guinebretière

Download or read book X-Ray Diffraction by Polycrystalline Materials written by René Guinebretière and published by John Wiley & Sons. This book was released on 2013-03-01 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.


X-Ray Diffraction by Polycrystalline Materials Related Books

X-Ray Diffraction by Polycrystalline Materials
Language: en
Pages: 290
Authors: René Guinebretière
Categories: Technology & Engineering
Type: BOOK - Published: 2013-03-01 - Publisher: John Wiley & Sons

GET EBOOK

This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-r
X-ray Diffraction Procedures
Language: en
Pages: 716
Authors: Harold P. Klug
Categories:
Type: BOOK - Published: 1959 - Publisher:

GET EBOOK

X-Ray Diffraction Crystallography
Language: en
Pages: 320
Authors: Yoshio Waseda
Categories: Technology & Engineering
Type: BOOK - Published: 2011-03-18 - Publisher: Springer Science & Business Media

GET EBOOK

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the ato
Thin Film Analysis by X-Ray Scattering
Language: en
Pages: 378
Authors: Mario Birkholz
Categories: Technology & Engineering
Type: BOOK - Published: 2006-05-12 - Publisher: John Wiley & Sons

GET EBOOK

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m
X-Ray Line Profile Analysis in Materials Science
Language: en
Pages: 359
Authors: Gubicza, Jen?
Categories: Technology & Engineering
Type: BOOK - Published: 2014-03-31 - Publisher: IGI Global

GET EBOOK

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting resea