Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems
Author :
Publisher : Springer Science & Business Media
Total Pages : 331
Release :
ISBN-10 : 9781441969934
ISBN-13 : 1441969934
Rating : 4/5 (934 Downloads)

Book Synopsis Soft Errors in Modern Electronic Systems by : Michael Nicolaidis

Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2010-09-24 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.


Soft Errors in Modern Electronic Systems Related Books

Architecture Design for Soft Errors
Language: en
Pages: 361
Authors: Shubu Mukherjee
Categories: Computers
Type: BOOK - Published: 2011-08-29 - Publisher: Morgan Kaufmann

GET EBOOK

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new met
Soft Errors in Modern Electronic Systems
Language: en
Pages: 331
Authors: Michael Nicolaidis
Categories: Technology & Engineering
Type: BOOK - Published: 2010-09-24 - Publisher: Springer Science & Business Media

GET EBOOK

This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and miti
Soft Errors
Language: en
Pages: 432
Authors: Jean-Luc Autran
Categories: Technology & Engineering
Type: BOOK - Published: 2017-12-19 - Publisher: CRC Press

GET EBOOK

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics proble
Soft Errors
Language: en
Pages: 439
Authors: Jean-Luc Autran
Categories:
Type: BOOK - Published: 2020-09-30 - Publisher: CRC Press

GET EBOOK

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics proble
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Language: en
Pages: 131
Authors: Alexandra Zimpeck
Categories: Technology & Engineering
Type: BOOK - Published: 2021-03-10 - Publisher: Springer Nature

GET EBOOK

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET