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Language: en
Pages: 0
Pages: 0
Type: BOOK - Published: 2022 - Publisher:
This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices ar
Language: en
Pages: 322
Pages: 322
Type: BOOK - Published: 2021-11-25 - Publisher: Springer Nature
This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices ar
Language: en
Pages: 805
Pages: 805
Type: BOOK - Published: 2013-10-22 - Publisher: Springer Science & Business Media
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias tempera
Language: en
Pages: 282
Pages: 282
Type: BOOK - Published: 2015-08-05 - Publisher: Springer
This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circui
Language: en
Pages: 405
Pages: 405
Type: BOOK - Published: - Publisher: Springer Nature