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Language: en
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Type: BOOK - Published: 2019-05-20 - Publisher: CRC Press
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Type: BOOK - Published: 2019-05-20 - Publisher: CRC Press
Classical Charged Particle Beam Optics used in the design and operation of all present-day charged particle beam devices, from low energy electron microscopes t
Language: en
Pages: 248
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Type: BOOK - Published: 2022-05-26 - Publisher: CRC Press
Fourier analysis is one of the most important concepts when you apply physical ideas to engineering issues. This book provides a comprehensive understanding of
Language: en
Pages: 252
Pages: 252
Type: BOOK - Published: 2023-08-17 - Publisher: Elsevier
Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long
Language: en
Pages: 818
Pages: 818
Type: BOOK - Published: 1999-04-19 - Publisher: World Scientific
The frontiers of beam research point to increasingly high energy, greater brightness and lower emittance beams with ever-increasing particle species. These dema