Nanoscale Stresses Simulation and Characterization of Deep Sub-micron Semiconductor Devices
| Author | : Jian Li |
| Publisher | : |
| Total Pages | : 410 |
| Release | : 2006 |
| ISBN-10 | : UVA:X030123239 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Nanoscale Stresses Simulation and Characterization of Deep Sub-micron Semiconductor Devices by : Jian Li
Download or read book Nanoscale Stresses Simulation and Characterization of Deep Sub-micron Semiconductor Devices written by Jian Li and published by . This book was released on 2006 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt:
