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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
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Authors: Alexandra Zimpeck
Categories: Technology & Engineering
Type: BOOK - Published: 2021-03-10 - Publisher: Springer Nature

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This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET
Dependable Embedded Systems
Language: en
Pages: 606
Authors: Jörg Henkel
Categories: Technology & Engineering
Type: BOOK - Published: 2020-12-09 - Publisher: Springer Nature

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This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly wi
Nyquist AD Converters, Sensor Interfaces, and Robustness
Language: en
Pages: 0
Authors: Arthur van Roermund
Categories: Technology & Engineering
Type: BOOK - Published: 2014-12-13 - Publisher: Springer

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This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information abou
Compact Modeling
Language: en
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Authors: Gennady Gildenblat
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Type: BOOK - Published: 2010-06-22 - Publisher: Springer Science & Business Media

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Most of the recent texts on compact modeling are limited to a particular class of semiconductor devices and do not provide comprehensive coverage of the field.
Nano-CMOS Circuit and Physical Design
Language: en
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Authors: Ban Wong
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Type: BOOK - Published: 2005-04-08 - Publisher: John Wiley & Sons

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Based on the authors' expansive collection of notes taken over the years, Nano-CMOS Circuit and Physical Design bridges the gap between physical and circuit des