Microelectronics Failure Analysis Techniques
Author | : Ed Doyle |
Publisher | : |
Total Pages | : 700 |
Release | : 1983* |
ISBN-10 | : OCLC:227525710 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Download or read book Microelectronics Failure Analysis Techniques written by Ed Doyle and published by . This book was released on 1983* with total page 700 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objective of this procedural guide was not to present an expose of device failure modes/mechanisms and applicable techniques for detection, identification and measurement but rather to provide a treatise on proven failure analysis techniques, equipment, procedures and expected analytical results. The guide thus represents a compilation and description of practical semiconductor failure analysis techniques rather than failure analysis flow sequences for verifying specific device failure mechanisms. (Author).