Hot-carrier reliability of strain-engineered MOSFETs
| Author | : David Quest Kelly |
| Publisher | : |
| Total Pages | : 132 |
| Release | : 2003 |
| ISBN-10 | : OCLC:54715690 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Hot-carrier reliability of strain-engineered MOSFETs by : David Quest Kelly
Download or read book Hot-carrier reliability of strain-engineered MOSFETs written by David Quest Kelly and published by . This book was released on 2003 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt:
