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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of
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Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics an
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Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics an
Proceedings of the Symposium on Electromigration of Metals and First International Symposium on Multilevel Metallization and Packaging
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This text describes the mathematical formulation and proof of the unified mechanics theory (UMT) which is based on the unification of Newton’s laws and the la