Circuit Design for Reliability

Circuit Design for Reliability
Author :
Publisher : Springer
Total Pages : 271
Release :
ISBN-10 : 9781461440789
ISBN-13 : 1461440785
Rating : 4/5 (785 Downloads)

Book Synopsis Circuit Design for Reliability by : Ricardo Reis

Download or read book Circuit Design for Reliability written by Ricardo Reis and published by Springer. This book was released on 2014-11-08 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.


Circuit Design for Reliability Related Books

Circuit Design for Reliability
Language: en
Pages: 271
Authors: Ricardo Reis
Categories: Technology & Engineering
Type: BOOK - Published: 2014-11-08 - Publisher: Springer

GET EBOOK

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enha
Integrated Circuit Quality and Reliability
Language: en
Pages: 736
Authors: Eugene R. Hnatek
Categories: Technology & Engineering
Type: BOOK - Published: 1987 - Publisher:

GET EBOOK

Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edi
CMOS RF Circuit Design for Reliability and Variability
Language: en
Pages: 108
Authors: Jiann-Shiun Yuan
Categories: Technology & Engineering
Type: BOOK - Published: 2016-04-13 - Publisher: Springer

GET EBOOK

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits
Soft Error Reliability of VLSI Circuits
Language: en
Pages: 114
Authors: Behnam Ghavami
Categories: Technology & Engineering
Type: BOOK - Published: 2020-10-13 - Publisher: Springer Nature

GET EBOOK

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in desig
Hot-Carrier Reliability of MOS VLSI Circuits
Language: en
Pages: 223
Authors: Yusuf Leblebici
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

GET EBOOK

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming a