Atomic-scale Defects Involved in the Negative Bias Temperature Instability in SIO2 and Plasma-nitrided Oxide Based PMOSFETs
| Author | : Jason P. Campbell |
| Publisher | : |
| Total Pages | : |
| Release | : 2007 |
| ISBN-10 | : OCLC:180198800 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Atomic-scale Defects Involved in the Negative Bias Temperature Instability in SIO2 and Plasma-nitrided Oxide Based PMOSFETs by : Jason P. Campbell
Download or read book Atomic-scale Defects Involved in the Negative Bias Temperature Instability in SIO2 and Plasma-nitrided Oxide Based PMOSFETs written by Jason P. Campbell and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
