Advanced Computing in Electron Microscopy

Advanced Computing in Electron Microscopy
Author :
Publisher : Springer Science & Business Media
Total Pages : 289
Release :
ISBN-10 : 9781441965332
ISBN-13 : 1441965335
Rating : 4/5 (335 Downloads)

Book Synopsis Advanced Computing in Electron Microscopy by : Earl J. Kirkland

Download or read book Advanced Computing in Electron Microscopy written by Earl J. Kirkland and published by Springer Science & Business Media. This book was released on 2010-08-12 with total page 289 pages. Available in PDF, EPUB and Kindle. Book excerpt: Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.


Advanced Computing in Electron Microscopy Related Books

Advanced Computing in Electron Microscopy
Language: en
Pages: 289
Authors: Earl J. Kirkland
Categories: Science
Type: BOOK - Published: 2010-08-12 - Publisher: Springer Science & Business Media

GET EBOOK

Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New
Electron Energy-Loss Spectroscopy in the Electron Microscope
Language: en
Pages: 491
Authors: R.F. Egerton
Categories: Science
Type: BOOK - Published: 2013-03-09 - Publisher: Springer Science & Business Media

GET EBOOK

to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron ener
Applications of Physical Methods to Inorganic and Bioinorganic Chemistry
Language: en
Pages: 597
Authors: Robert A. Scott
Categories: Science
Type: BOOK - Published: 2007-12-10 - Publisher: John Wiley & Sons

GET EBOOK

Modern spectroscopic and instrumental techniques are essential to the practice of inorganic and bioinorganic chemistry. This first volume in the new Wiley Encyc
Scanning Transmission Electron Microscopy
Language: en
Pages: 764
Authors: Stephen J. Pennycook
Categories: Technology & Engineering
Type: BOOK - Published: 2011-03-24 - Publisher: Springer Science & Business Media

GET EBOOK

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of th
Aberration-Corrected Analytical Transmission Electron Microscopy
Language: en
Pages: 235
Authors: Rik Brydson
Categories: Science
Type: BOOK - Published: 2011-08-02 - Publisher: John Wiley & Sons

GET EBOOK

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of s