Transmission Electron Microscopy and Diffractometry of Materials
Author | : Brent Fultz |
Publisher | : Springer Science & Business Media |
Total Pages | : 771 |
Release | : 2007-11-04 |
ISBN-10 | : 9783540738862 |
ISBN-13 | : 354073886X |
Rating | : 4/5 (86X Downloads) |
Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2007-11-04 with total page 771 pages. Available in PDF, EPUB and Kindle. Book excerpt: This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.