This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-st

Welcome to the proceedings of PATMOS 2008, the 18th in a series of int- national workshops. PATMOS 2008 was organized by INESC-ID / IST - TU Lisbon, Portugal, w

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and effici

The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniq

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (