Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there

Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients