Radiation Effects, Negative-bias-temperature Instability, and Low-frequency L/f Noise in SiGe/SiO2/HfO2 PMOS Devices
| Author | : Guoxing Duan |
| Publisher | : |
| Total Pages | : 82 |
| Release | : 2016 |
| ISBN-10 | : OCLC:956740768 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Radiation Effects, Negative-bias-temperature Instability, and Low-frequency L/f Noise in SiGe/SiO2/HfO2 PMOS Devices by : Guoxing Duan
Download or read book Radiation Effects, Negative-bias-temperature Instability, and Low-frequency L/f Noise in SiGe/SiO2/HfO2 PMOS Devices written by Guoxing Duan and published by . This book was released on 2016 with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt:
