The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin m

Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principle

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an over

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the