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Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise
Kelvin Probe Force Microscopy
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This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an over
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The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscal
Surface Science Tools for Nanomaterials Characterization
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Exploring Scanning Probe Microscopy with MATHEMATICA
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This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the