Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature
| Author | : SeokWon Abraham Kim |
| Publisher | : |
| Total Pages | : 302 |
| Release | : 1999 |
| ISBN-10 | : OCLC:43496249 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature by : SeokWon Abraham Kim
Download or read book Hot-carrier Reliability of MOSFETs at Room and Cryogenic Temperature written by SeokWon Abraham Kim and published by . This book was released on 1999 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt:
