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Language: en
Pages: 1
Pages: 1
Type: BOOK - Published: 2013 - Publisher:
Language: en
Pages: 805
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Type: BOOK - Published: 2013-10-22 - Publisher: Springer Science & Business Media
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias tempera
Language: en
Pages: 322
Pages: 322
Type: BOOK - Published: 2021-11-25 - Publisher: Springer Nature
This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices ar
Language: en
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Pages: 57
Type: BOOK - Published: 2006 - Publisher:
The phenomenon known as Negative Bias Temperature Instability (NBTI) impacts the operational characteristics of Complementary Metal Oxide Semiconductor (CMOS) d
Language: en
Pages: 6
Pages: 6
Type: BOOK - Published: 2013 - Publisher: