Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. T

Discover new keys to solving analytical problems using the Latest sample preparation methods Commonly viewed of as a routine task rather than as an integral com

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States.

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh Univ