Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories

Comprehensive coverage of memory test problems at chip, array and board level is provided in this book. For each of these test levels a class of fault models is

This report deals with the problems of testing semiconductor random access memories and of locating faults on a memory board. Memory test procedures can be divi

Currently available memory testing algorithms were reviewed and evaluated to assess their inadequacies in testing large scale integrated circuit random access m