Elastic and Inelastic Scattering in Electron Diffraction and Imaging

Elastic and Inelastic Scattering in Electron Diffraction and Imaging
Author :
Publisher : Springer Science & Business Media
Total Pages : 461
Release :
ISBN-10 : 9781489915795
ISBN-13 : 1489915796
Rating : 4/5 (796 Downloads)

Book Synopsis Elastic and Inelastic Scattering in Electron Diffraction and Imaging by : Zhong-lin Wang

Download or read book Elastic and Inelastic Scattering in Electron Diffraction and Imaging written by Zhong-lin Wang and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 461 pages. Available in PDF, EPUB and Kindle. Book excerpt: Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J.


Elastic and Inelastic Scattering in Electron Diffraction and Imaging Related Books

Elastic and Inelastic Scattering in Electron Diffraction and Imaging
Language: en
Pages: 461
Authors: Zhong-lin Wang
Categories: Science
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media

GET EBOOK

Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically sum
Transmission Electron Microscopy
Language: en
Pages: 708
Authors: David B. Williams
Categories: Science
Type: BOOK - Published: 2013-03-09 - Publisher: Springer Science & Business Media

GET EBOOK

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-str
Electron Backscatter Diffraction in Materials Science
Language: en
Pages: 406
Authors: Adam J. Schwartz
Categories: Technology & Engineering
Type: BOOK - Published: 2010-03-11 - Publisher: Springer Science & Business Media

GET EBOOK

Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic textu
Scanning Electron Microscopy
Language: en
Pages: 538
Authors: Ludwig Reimer
Categories: Science
Type: BOOK - Published: 2013-11-11 - Publisher: Springer

GET EBOOK

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and
Transmission Electron Microscopy and Diffractometry of Materials
Language: en
Pages: 775
Authors: Brent Fultz
Categories: Science
Type: BOOK - Published: 2012-10-14 - Publisher: Springer Science & Business Media

GET EBOOK

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T