Atomic Force Microscopy/Scanning Tunneling Microscopy

Atomic Force Microscopy/Scanning Tunneling Microscopy
Author :
Publisher : Springer Science & Business Media
Total Pages : 468
Release :
ISBN-10 : 9780306448904
ISBN-13 : 0306448904
Rating : 4/5 (904 Downloads)

Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 1994 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various symposium topics included application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments including new probe microscopies. The procee.


Atomic Force Microscopy/Scanning Tunneling Microscopy Related Books

Atomic Force Microscopy/Scanning Tunneling Microscopy
Language: en
Pages: 468
Authors: Samuel H. Cohen
Categories: Science
Type: BOOK - Published: 1994 - Publisher: Springer Science & Business Media

GET EBOOK

Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various sy
Scanning Probe Microscopy
Language: en
Pages: 375
Authors: Bert Voigtländer
Categories: Technology & Engineering
Type: BOOK - Published: 2015-02-24 - Publisher: Springer

GET EBOOK

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operat
Atomic Force Microscopy/Scanning Tunneling Microscopy 2
Language: en
Pages: 264
Authors: Samuel H. Cohen
Categories: Science
Type: BOOK - Published: 1997-04-30 - Publisher: Springer Science & Business Media

GET EBOOK

Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Surface Analysis with STM and AFM
Language: en
Pages: 335
Authors: Sergei N. Magonov
Categories: Technology & Engineering
Type: BOOK - Published: 2008-09-26 - Publisher: John Wiley & Sons

GET EBOOK

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to e
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Language: en
Pages: 634
Authors: Bharat Bhushan
Categories: Science
Type: BOOK - Published: 2012-10-16 - Publisher: Springer Science & Business Media

GET EBOOK

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive