Related Books

Radiation Effects, Negative-bias-temperature Instability, and Low-frequency L/f Noise in SiGe/SiO2/HfO2 PMOS Devices
Language: en
Pages: 82

Radiation Effects, Negative-bias-temperature Instability, and Low-frequency L/f Noise in SiGe/SiO2/HfO2 PMOS Devices

Authors: Guoxing Duan
Categories: Electromagnetic noise
Type: BOOK - Published: 2016 - Publisher:

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Total Ionizing Dose Radiation Effects and Negative Bias Temperature Instability on SiGe PMOS Devices
Language: en
Pages: 47

Total Ionizing Dose Radiation Effects and Negative Bias Temperature Instability on SiGe PMOS Devices

Authors: Guoxing Duan
Categories: Electronic dissertations
Type: BOOK - Published: 2014 - Publisher:

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Recent Advances in PMOS Negative Bias Temperature Instability
Language: en
Pages: 0

Recent Advances in PMOS Negative Bias Temperature Instability

Authors: Souvik Mahapatra
Categories: Technology & Engineering
Type: BOOK - Published: 2022-11-27 - Publisher: Springer

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This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices ar
Similarities Between Ionizing Radiation Effects and Negative-Bias Temperature Instability (NBTI) in MOSFET Devices
Language: en
Pages: 6

Similarities Between Ionizing Radiation Effects and Negative-Bias Temperature Instability (NBTI) in MOSFET Devices

Authors:
Categories:
Type: BOOK - Published: 2013 - Publisher:

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Atomic-scale Defects Involved in the Negative Bias Temperature Instability in SIO2 and Plasma-nitrided Oxide Based PMOSFETs
Language: en
Pages:

Atomic-scale Defects Involved in the Negative Bias Temperature Instability in SIO2 and Plasma-nitrided Oxide Based PMOSFETs

Authors: Jason P. Campbell
Categories:
Type: BOOK - Published: 2007 - Publisher:

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