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Noncontact Atomic Force Microscopy
Language: en
Pages: 448
Authors: S. Morita
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra
Noncontact Atomic Force Microscopy
Language: en
Pages: 410
Authors: Seizo Morita
Categories: Technology & Engineering
Type: BOOK - Published: 2009-09-18 - Publisher: Springer Science & Business Media

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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress.
Noncontact Atomic Force Microscopy
Language: en
Pages: 539
Authors: Seizo Morita
Categories: Science
Type: BOOK - Published: 2015-05-18 - Publisher: Springer

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This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have b
Amplitude Modulation Atomic Force Microscopy
Language: en
Pages: 212
Authors: Ricardo García
Categories: Technology & Engineering
Type: BOOK - Published: 2011-08-24 - Publisher: John Wiley & Sons

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Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental consider
Atomic Force Microscopy
Language: en
Pages: 329
Authors: Bert Voigtländer
Categories: Science
Type: BOOK - Published: 2019-05-23 - Publisher: Springer

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This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully a