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Type: BOOK - Published: 2016-07-14 - Publisher: Springer
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Language: en
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Type: BOOK - Published: 2012-12-02 - Publisher: Newnes
This conference consisted of 15 oral sessions, including three plenary papers covering areas of general interest, 22 specialist invited papers and 51 contribute
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A comprehensive review of ion beam application in modern materials research is provided, including the basics of ion beam physics and technology. The physics of
Language: en
Pages: 271
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Type: BOOK - Published: 2007-05-16 - Publisher: Springer Science & Business Media
Ion implantation is one of the key processing steps in silicon integrated circuit technology. Some integrated circuits require up to 17 implantation steps and c
Language: en
Pages: 496
Pages: 496
Type: BOOK - Published: 2007-09-13 - Publisher: Cambridge University Press
The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system wit