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Pages: 198
Type: BOOK - Published: 1981 - Publisher: CRC Press
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This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circui
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Type: BOOK - Published: 1977 - Publisher:
A very important factor in the reliability of MOS devices is the stability of the threshold voltage. This dissertation examines the effects of positive and nega
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Pages: 772
Pages: 772
Type: BOOK - Published: 2008-11-19 - Publisher: CRC Press
Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that eng