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Language: en
Pages: 213
Authors: Kai-hui Chang
Categories: Technology & Engineering
Type: BOOK - Published: 2008-12-02 - Publisher: Springer Science & Business Media

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Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow
Computer Literature Bibliography
Language: en
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Authors: United States. National Bureau of Standards
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NBS Special Publication
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Post-Silicon and Runtime Verification for Modern Processors
Language: en
Pages: 240
Authors: Ilya Wagner
Categories: Technology & Engineering
Type: BOOK - Published: 2010-11-25 - Publisher: Springer Science & Business Media

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The purpose of this book is to survey the state of the art and evolving directions in post-silicon and runtime verification. The authors start by giving an over