Related Books
Language: en
Pages: 182
Pages: 182
Type: BOOK - Published: 1999 - Publisher:
Language: en
Pages: 422
Pages: 422
Type: BOOK - Published: 1995 - Publisher:
Language: en
Pages: 182
Pages: 182
Type: BOOK - Published: 2017-01-27 - Publisher: Open Dissertation Press
This dissertation, "Hot-carrier-induced Instabilities in N-mosfet's With Thermally Nitrided Oxide as Gate Dielectric" by 馬志堅, Zhi-jian, Ma, was obtained f
Language: en
Pages: 345
Pages: 345
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design
Language: en
Pages: 334
Pages: 334
Type: BOOK - Published: 1992 - Publisher: