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Bias Temperature Instability for Devices and Circuits
Language: en
Pages: 805
Authors: Tibor Grasser
Categories: Technology & Engineering
Type: BOOK - Published: 2013-10-22 - Publisher: Springer Science & Business Media

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This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias tempera
Fundamentals of Bias Temperature Instability in MOS Transistors
Language: en
Pages: 282
Authors: Souvik Mahapatra
Categories: Technology & Engineering
Type: BOOK - Published: 2015-08-05 - Publisher: Springer

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This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circui
Recent Advances in PMOS Negative Bias Temperature Instability
Language: en
Pages: 322
Authors: Souvik Mahapatra
Categories: Technology & Engineering
Type: BOOK - Published: 2021-11-25 - Publisher: Springer Nature

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This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices ar
Adiabatic Logic
Language: en
Pages: 176
Authors: Philip Teichmann
Categories: Technology & Engineering
Type: BOOK - Published: 2011-10-29 - Publisher: Springer Science & Business Media

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Adiabatic logic is a potential successor for static CMOS circuit design when it comes to ultra-low-power energy consumption. Future development like the evoluti
Hot Carrier Degradation in Semiconductor Devices
Language: en
Pages: 518
Authors: Tibor Grasser
Categories: Technology & Engineering
Type: BOOK - Published: 2014-10-29 - Publisher: Springer

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This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability iss