This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias tempera

This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circui

This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices ar

Adiabatic logic is a potential successor for static CMOS circuit design when it comes to ultra-low-power energy consumption. Future development like the evoluti

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability iss