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Language: en
Pages: 468
Pages: 468
Type: BOOK - Published: 1994 - Publisher: Springer Science & Business Media
Papers presented at the first US Army Natick Research, Development and Engineering Center Symposium on [title], held in Natick, Mass., June 1993. The various sy
Language: en
Pages: 359
Pages: 359
Type: BOOK - Published: 2013-03-08 - Publisher: Springer Science & Business Media
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications
Language: en
Pages: 243
Pages: 243
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to
Language: en
Pages: 335
Pages: 335
Type: BOOK - Published: 2008-09-26 - Publisher: John Wiley & Sons
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to e
Language: en
Pages: 488
Pages: 488
Type: BOOK - Published: 2015-12-17 - Publisher: Oxford University Press, USA
The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize