19th IEEE VLSI Test Symposium

19th IEEE VLSI Test Symposium
Author :
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Total Pages : 458
Release :
ISBN-10 : 0769511228
ISBN-13 : 9780769511221
Rating : 4/5 (221 Downloads)

Book Synopsis 19th IEEE VLSI Test Symposium by :

Download or read book 19th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 2001 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.


19th IEEE VLSI Test Symposium Related Books

19th IEEE VLSI Test Symposium
Language: en
Pages: 458
Authors:
Categories: Computers
Type: BOOK - Published: 2001 - Publisher: Institute of Electrical & Electronics Engineers(IEEE)

GET EBOOK

Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are dis
16th IEEE VLSI Test Symposium
Language: en
Pages: 528
Authors:
Categories: Application-specific integrated circuits
Type: BOOK - Published: 1998 - Publisher:

GET EBOOK

IEEE VLSI Test Symposium
Language: en
Pages: 498
Authors:
Categories: Application-specific integrated circuits
Type: BOOK - Published: 2005 - Publisher:

GET EBOOK

18th IEEE VLSI Test Symposium
Language: en
Pages: 528
Authors:
Categories: Computers
Type: BOOK - Published: 2000 - Publisher: Institute of Electrical & Electronics Engineers(IEEE)

GET EBOOK

Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and sys
Proceedings of the First International Workshop on Coding and Cryptology, Wuyi Mountain, Fujian, China 11-15 June 2007
Language: en
Pages: 288
Authors: Yongqing Li
Categories: Computers
Type: BOOK - Published: 2008 - Publisher: World Scientific

GET EBOOK

The thrid and final DVD in the ED'S STORY series contains the following films: My Garden and Ask Forgiveness My Garden: When we meet someone, one of the first q